Product Description
The Rudolph ellipsometer is an optical instrument for measuring film thickness and index of refraction. It works by allowing light of known polarization to interact with a thin film structure. In general, the reflected light has a polarization different from the incident light. Knowing the polarization states of the light before and after reflection allows you to calculate film thickness and refractive index (given certain assumptions about the film structure).
There are 3 parts to this system, although only one is shown.
Sold As-is, as pictured, Final Sale.
Additional photos available upon request.
