Metricon Model 2010 Prism Coupler, OEM2P/40CM Laser, Aerotech PS2-230V

The Model 2010 Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both the thickness and the refractive /birefringence of dielectric and polymer films. For many thin film and optical waveguide applications, the Model 2010 offers unique advantages over conventional instruments based on ellipsometry or spectrophotometry:

• no advance knowledge of thickness or required
• routine resolution of ±.0005 ­ an order of magnitude better than other techniques, (higher resolution available)
• completely general ­ no fixed menus of film/substrate combinations
• measures thickness and for each film of dual film structures
• high accuracy measurement of bulk or substrate materials
• easy measurement of anisotropy/birefringence
• rapid (20-second) characterization of thin film or diffused optical waveguides