The HP 4156A is the next generation in precision semiconductor parameter analyzer. You get the best digital sweep parameter analyzer plus a reliability tester, powerful failure-analysis tool, and automated incoming inspection station, all rolled into a single instrument. This new family was explicitly designed to provide unprecedented accuracy and functionality for evaluating your sub-micron geometry devices. With one flexible instrument, you can improve your semi-conductor quality starting from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis.

FEATURES:

• High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy) V: 1µV to 200 V
• Fully-automated I-V sweep measurements with dc or pulse mode expandable up to 6 SMUs
• Synchronized stress/measure function two high-voltage pulse generator units (±40 V)
• Time-domain measurement: 60µs - variable intervals up to 10 001 points
• Easy to use: knob-sweep similar to curve tracer automatic analysis functions
• Automation: built-in HP Instrument BASIC trigger I/O capability
  
  This unit comes with HP16442A test fixture (see picture) and the following cables:
• BNC interconnect cable qty 4
• Cable for Intlk qty 1
• HP 04155-61602 Kelvin Triaxial Cable (3m) qty 3

"